Litcius/Paper detail

Comprehensive investigation on different ions of geostationary orbit induced single event burnout in GaN HEMT power devices

Wangran Wu, Wenting Xu, Kai Qu, Guangan Yang, Zuoxu Yu, Weifeng Sun

2023Microelectronics Reliability11 citationsDOI

Topics & Concepts

High-electron-mobility transistorIonMaterials scienceGeostationary orbitIrradiationOptoelectronicsLinear energy transferVoltagePower (physics)Electrical engineeringPhysicsTransistorEngineeringNuclear physicsAstronomyQuantum mechanicsSatelliteRadiation Effects in ElectronicsRadiation Detection and Scintillator TechnologiesPhotocathodes and Microchannel Plates