Experimental analysis, discrete modeling and parameter optimization of SLS-printed bi-pantographic structures
Jonas Harsch, Gregor Ganzosch, Emilio Barchiesi, Alessandro Ciallella, Simon R. Eugster
Abstract
Making use of experimental data for bias extension, shearing, and point-load tests in large deformation regime for rectangular and square bi-pantographic specimens, we perform a numerical identification to fit the a priori parameters of a planar discrete spring model. The main objective of the work is to develop an automatized optimization process based on the Nelder–Mead simplex algorithm for identifying the constitutive parameters of discrete modeling of bi-pantographic structures, as well as assessing its descriptiveness and predictive capacity. The analysis allows to conclude that there exists a single set of parameters for the adopted discrete modeling such that it is descriptive and predictive for several different tests and for a wide range of deformations.