Direct atomic-scale visualization of the 90° domain walls and their migrations in Hf0.5Zr0.5O2 ferroelectric thin films
Yunzhe Zheng, Yuke Zhang, Tianjiao Xin, Yilin Xu, Shuangquan Qu, Jun‐Ding Zheng, Zhaomeng Gao, Qilan Zhong, Yiwei Wang, Xiaoyu Feng, Yonghui Zheng, Yan Cheng, Ruiwen Shao, Fang Lin, Xiaoling Lin, He Tian, Rong Huang, Chun‐Gang Duan, Hangbing Lyu
Topics & Concepts
FerroelectricityAtomic unitsMaterials sciencePolarization (electrochemistry)HafniaPerovskite (structure)Thin filmTransmission electron microscopyCrystallographic defectScanning transmission electron microscopyCondensed matter physicsOptoelectronicsNanotechnologyCrystallographyChemistryPhysicsComposite materialCeramicDielectricPhysical chemistryQuantum mechanicsCubic zirconiaFerroelectric and Negative Capacitance DevicesFerroelectric and Piezoelectric MaterialsMXene and MAX Phase Materials