Total internal reflection microscopy: a powerful tool for exploring interactions and dynamics near interfaces
Jiahao Wu, Wei Liu, To Ngai
Abstract
The occurrence of many micro/macrophenomena is closely related to interactions and dynamics near interfaces. Hence, developing powerful tools for characterizing near-interface interactions and dynamics has attached great importance among researchers. In this review, we introduce a noninvasive and ultrasensitive technique called total internal reflection microscopy (TIRM). The principles of TIRM are introduced first, demonstrating the characteristics of this technique. Then, typical measurements with TIRM and the recent development of the technique are reviewed in detail. At the end of the review, we highlight the great progress of TIRM during the past several decades and show its potential to be more influential in measuring interactions and dynamics near interfaces in various research fields.