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Fault Location Estimation in Voltage-Source-Converter-Based DC System: The $L$ Location

Dongyu Li, Abhisek Ukil

2021IEEE Transactions on Industrial Electronics17 citationsDOI

Abstract

This article presents a new method for estimating the fault location in a voltage-source-converter-interfaced dc system. The proposed dc fault location estimation method evaluates the distance from the fault point to the dc line terminal by estimating the line inductance; hence, it is designated as <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"><tex-math notation="LaTeX">$L$</tex-math></inline-formula> location. Since the fault impedance usually only includes resistance, the proposed <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"><tex-math notation="LaTeX">$L$</tex-math></inline-formula> location is less affected by the variation of fault resistance. In addition, the ripple caused by the distributed capacitive discharge is excluded from the dc line current when the proposed <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"><tex-math notation="LaTeX">$L$</tex-math></inline-formula> location is applied in the dc system with the distributed-parameter transmission line. The cubic curve-fitting method is used to reconstruct the current signal based on the least squares method. The effectiveness of the proposed <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"><tex-math notation="LaTeX">$L$</tex-math></inline-formula> location is verified with an OPAL-RT-based multiterminal dc (MTDC) system and experimental point-to-point and MTDC systems. The comparison with the impedance estimation, the voltage-traveling-wave-based location, and the differential and directional protection substantiates the integral performance of the proposed method

Topics & Concepts

AlgorithmLine (geometry)Fault (geology)NotationPoint (geometry)Topology (electrical circuits)MathematicsComputer scienceEngineeringElectrical engineeringGeometryArithmeticSeismologyGeologyHVDC Systems and Fault ProtectionSilicon Carbide Semiconductor TechnologiesHigh voltage insulation and dielectric phenomena
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