Performance variation of solution-processed memristor induced by different top electrode
Zongjie Shen, Chun Zhao, Chun Zhao, Yina Liu, Yanfei Qi, Ivona Z. Mitrović, Li Yang, Cezhou Zhao, Cezhou Zhao
Topics & Concepts
Resistive random-access memoryMaterials scienceTinElectrodeAnnealing (glass)OptoelectronicsWork functionVoltageMemristorMetallurgyComposite materialElectrical engineeringLayer (electronics)ChemistryEngineeringPhysical chemistryAdvanced Memory and Neural ComputingTransition Metal Oxide NanomaterialsFerroelectric and Negative Capacitance Devices