Defects in an orthorhombic MoAlB MAB phase thin film grown at moderate synthesis temperature
Rajib Sahu, Dimitri Bogdanovski, Jan-Ole Achenbach, Jochen M. Schneider, Christina Scheu
Abstract
regions, a few nanometer-sized 3D MoB clusters are found. The advancement of aberration-corrected scanning transmission electron microscopy significantly improves characterization from 1D to 3D defects which is important for thin film materials design for the moderate synthesis temperature range. The reported defects might play an important role in the formation of 2D MoB MBenes.
Topics & Concepts
Materials scienceOrthorhombic crystal systemAmorphous solidTransmission electron microscopyGrain boundaryMetastabilityPhase (matter)CrystallographyThin filmCharacterization (materials science)Scanning transmission electron microscopyScanning electron microscopeChemical physicsNanotechnologyMicrostructureComposite materialChemistryCrystal structureOrganic chemistryMXene and MAX Phase Materials2D Materials and ApplicationsAdvanced ceramic materials synthesis