Deriving the linear dynamic range of next-generation thin-film photodiodes: Pitfalls and guidelines
Hrisheekesh Thachoth Chandran, Sudhi Mahadevan, Ruijie Ma, Yu Tang, Tao Zhu, Furong Zhu, Sai‐Wing Tsang, Gang Li
Abstract
With the use of next-generation semiconductors, notably organic and perovskite materials with remarkable optoelectronic and mechanical properties, thin-film photodiodes are progressing rapidly to rival their inorganic counterparts. However, to ensure a trustworthy comparison among the reported works, it is imperative that the measurement techniques for the figure of merits be unified and standardized. In this Letter, the possible causes of misrepresentation in the linear dynamic range (LDR) values are thoroughly discussed. The role of unity slope in defining the deviation point is examined, and the chances of misinterpretation when adopting different definitions are explained using a representative organic photodiode system. Furthermore, certain criteria are put out to standardize the LDR representation, which could be a crucial step toward facilitating the progress in this promising field via a more rational comparison of literature reports.