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Orientation dependence of mechanically induced grain boundary migration in nano-grained copper

Jianxin Hou, Xiuyan Li, K. Lu

2020Journal of Material Science and Technology30 citationsDOI

Topics & Concepts

Materials scienceGrain boundaryElectron backscatter diffractionGrain boundary strengtheningCopperCondensed matter physicsOrientation (vector space)DiffractionUltimate tensile strengthComposite materialGrain sizeMetallurgyCrystallographyMicrostructureGeometryOpticsPhysicsMathematicsChemistryMicrostructure and mechanical propertiesMetal and Thin Film MechanicsAluminum Alloys Composites Properties
Orientation dependence of mechanically induced grain boundary migration in nano-grained copper | Litcius