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Multi-stage few-shot micro-defect detection of patterned OLED panel using defect inpainting and multi-scale Siamese neural network

Shujiao Ye, Zheng Wang, Pengbo Xiong, Xinhao Xu, Lintong Du, Jiubin Tan, Weibo Wang

2023Journal of Intelligent Manufacturing14 citationsDOI

Topics & Concepts

OverfittingArtificial intelligencePattern recognition (psychology)Computer scienceAutoencoderSegmentationArtificial neural networkInpaintingImage (mathematics)Industrial Vision Systems and Defect DetectionSurface Roughness and Optical MeasurementsAdvanced Neural Network Applications
Multi-stage few-shot micro-defect detection of patterned OLED panel using defect inpainting and multi-scale Siamese neural network | Litcius