New image dataset and new negative sample judgment method for crop pest recognition based on deep learning models
Kaili Wang, Keyu Chen, Huiyu Du, Shuang Liu, Jingwen Xu, Junfang Zhao, Houlin Chen, Yujun Liu, Yang Liu
Topics & Concepts
PEST analysisSample (material)Artificial intelligenceComputer scienceCropDeep learningMachine learningEcologyBiologyBotanyChromatographyChemistrySmart Agriculture and AIDate Palm Research StudiesInsect behavior and control techniques