Surface analysis by gas cluster ion beam XPS and ToF-SIMS tandem MS of 2-mercaptobenzoxazole corrosion inhibitor for brass
Matjaž Finšgar
Topics & Concepts
X-ray photoelectron spectroscopySecondary ion mass spectrometrySputteringStatic secondary-ion mass spectrometryBrassCorrosionAnalytical Chemistry (journal)Ion beamChemistryIonMass spectrometryMaterials scienceTandemCopperMetallurgyThin filmChemical engineeringNanotechnologyComposite materialChromatographyOrganic chemistryEngineeringIon-surface interactions and analysisSemiconductor materials and devicesAnalytical chemistry methods development