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Correlative multimodal imaging and targeted lasering for automated high-precision IC decapsulation

Nicholas May, Hongbin Choi, Adrian Phoulady, Yara Suleiman, Daniel DiMase, Pouya Tavousi, Sina Shahbazmohamadi

2022Microelectronics Reliability12 citationsDOI

Topics & Concepts

WorkflowMicroelectronicsAutomationComputer scienceFemtosecondLaserIntegrated circuitCorrelativeMicroscopyComputer hardwareReal-time computingEmbedded systemMaterials scienceNanotechnologyOpticsEngineeringPhysicsMechanical engineeringLinguisticsOperating systemPhilosophyDatabaseIntegrated Circuits and Semiconductor Failure AnalysisAdvancements in Photolithography TechniquesAdvanced Surface Polishing Techniques
Correlative multimodal imaging and targeted lasering for automated high-precision IC decapsulation | Litcius