Explainable AI for domain experts: a post Hoc analysis of deep learning for defect classification of TFT–LCD panels
Minyoung Lee, Joohyoung Jeon, Hong-Chul Lee
Topics & Concepts
InterpretabilityArtificial intelligenceReliability (semiconductor)Computer scienceField (mathematics)Domain (mathematical analysis)Machine learningDecision treeDeep learningRelevance (law)Data miningLiquid-crystal displayBlack boxPattern recognition (psychology)EngineeringMathematicsPower (physics)Quantum mechanicsOperating systemLawMathematical analysisPolitical sciencePure mathematicsPhysicsIndustrial Vision Systems and Defect DetectionInfrastructure Maintenance and MonitoringManufacturing Process and Optimization