Characterization of lattice parameters gradient of Cu(In1-Ga )Se2 absorbing layer in thin-film solar cell by glancing incidence X-ray diffraction technique
Yong‐Il Kim, Ki-Bok Kim, Miso Kim
Topics & Concepts
Materials scienceDiffractionSolar cellCharacterization (materials science)Incidence (geometry)Thin film solar cellLayer (electronics)Thin filmLattice (music)OpticsOptoelectronicsPhysicsComposite materialNanotechnologyAcousticsChalcogenide Semiconductor Thin FilmsQuantum Dots Synthesis And PropertiesSemiconductor materials and interfaces