Reliability of 3D NAND Flash for Future Storage Systems (Invited)

Akira Goda, K.K. Muchherla, Peter Feeley

202311 citationsDOI

Abstract

The 3D NAND Flash technologies have been successful, having realized the high density, high performance and highly reliable storage systems. With the continuous technology scaling, significant challenges and opportunities are expected in the future. SLC NAND technology plays a critical role for the high performance systems. The increased block size with further layer stacking requires innovative solutions to realize enhanced system performance and cost scaling. For the bits per cell (BPC) scaling beyond QLC, the reduction of the total cost of ownership (TCO) at the system level is the key. In this paper, we review and discuss the challenges and opportunities of 3D NAND reliability from the storage system perspectives.

Topics & Concepts

NAND gateFlash (photography)Reliability (semiconductor)Computer scienceScalingBlock (permutation group theory)Reduction (mathematics)Computer data storageReliability engineeringStackingKey (lock)Embedded systemCost reductionComputer hardwareLogic gateEngineeringOperating systemPhysicsEconomicsGeometryPower (physics)MathematicsOpticsQuantum mechanicsManagementNuclear magnetic resonanceAlgorithmAdvanced Data Storage TechnologiesCellular Automata and ApplicationsCaching and Content Delivery