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Analytical model for total ionizing dose-induced excess base current in PNP BJTs

L. Li, X.C. Chen, X.J. Li, Zelong Li, Y. Jian, Yuzhou Wu, Jiahao Zhang, Min Ren, Bo Zhang

2020Microelectronics Reliability12 citationsDOI

Topics & Concepts

Ionizing radiationBipolar junction transistorIonizationChemistryCurrent (fluid)AmplifierMaterials scienceBase (topology)OptoelectronicsIrradiationVoltageAtomic physicsElectrical engineeringTransistorPhysicsEngineeringMathematicsIonCMOSOrganic chemistryMathematical analysisNuclear physicsSemiconductor materials and devicesRadiation Effects in ElectronicsAdvancements in Semiconductor Devices and Circuit Design
Analytical model for total ionizing dose-induced excess base current in PNP BJTs | Litcius