An ultra-efficient design of fault-tolerant 3-input majority gate (FTMG) with an error probability model based on quantum-dots
Seyed‐Sajad Ahmadpour, Nima Jafari Navimipour, Sankit Kassa, Neeraj Kumar Misra, Şenay Yalçın
Topics & Concepts
Quantum dot cellular automatonAdderElectronic circuitElectronic engineeringComputer scienceCellular automatonDigital electronicsLogic gateDissipationFault toleranceAlgorithmEngineeringElectrical engineeringPhysicsDistributed computingCMOSThermodynamicsQuantum-Dot Cellular AutomataAdvanced Memory and Neural ComputingSemiconductor materials and devices