Embedding metric learning into an extreme learning machine for scene recognition
Chen Wang, Guohua Peng, Bernard De Baets
Topics & Concepts
Computer scienceArtificial intelligenceExtreme learning machineDiscriminative modelClassifier (UML)Machine learningEmbeddingLearning classifier systemPattern recognition (psychology)Metric (unit)Unsupervised learningArtificial neural networkEconomicsOperations managementMachine Learning and ELMDomain Adaptation and Few-Shot LearningMicroRNA in disease regulation