Litcius/Paper detail

Improvement of the defect inspection process of deteriorated buildings with scan to BIM and image-based automatic defect classification

Suhyun Kang, Seungho Kim, Seungho Kim, Sangyong Kim, Sangyong Kim

2024Journal of Building Engineering12 citationsDOI

Topics & Concepts

Visual inspectionProcess (computing)Computer scienceEngineeringArtificial intelligenceEngineering drawingOperating system3D Surveying and Cultural HeritageBIM and Construction IntegrationInfrastructure Maintenance and Monitoring
Improvement of the defect inspection process of deteriorated buildings with scan to BIM and image-based automatic defect classification | Litcius