Ways to Measure Metals: From ICP-MS to XRF
Kolawole E. Adesina, Chandler J. Burgos, Thomas Grier, Abu Sayed Mohammed Sayam, Aaron J. Specht
Topics & Concepts
Measure (data warehouse)Environmental chemistryInductively coupled plasma mass spectrometryChemistryMass spectrometryChromatographyComputer scienceData miningX-ray Spectroscopy and Fluorescence AnalysisAnalytical chemistry methods developmentHeavy Metal Exposure and Toxicity