Accelerated aging test for gate-oxide degradation in SiC MOSFETs for condition monitoring
S. Hayashi, Keiji Wãda
Topics & Concepts
Degradation (telecommunications)Materials scienceMOSFETOxideOptoelectronicsGate oxideAccelerated agingEngineering physicsElectronic engineeringReliability engineeringElectrical engineeringEngineeringMetallurgyComposite materialTransistorVoltageSilicon Carbide Semiconductor TechnologiesSemiconductor materials and devicesIntegrated Circuits and Semiconductor Failure Analysis