Quantifying Soybean Defects: A Computational Approach to Seed Classification Using Deep Learning Techniques
Amar V. Sable, Parminder Singh, Avinash Kaur, Maha Driss, Wadii Boulila
Abstract
This paper presents a computational approach for quantifying soybean defects through seed classification using deep learning techniques. To differentiate between good and defective soybean seeds quickly and accurately, we introduce a lightweight soybean seed defect identification network (SSDINet). Initially, the labeled soybean seed dataset is developed and processed through the proposed seed contour detection (SCD) algorithm, which enhances the quality of soybean seed images and performs segmentation, followed by SSDINet. The classification network, SSDINet, consists of a convolutional neural network, depthwise convolution blocks, and squeeze-and-excitation blocks, making the network lightweight, faster, and more accurate than other state-of-the-art approaches. Experimental results demonstrate that SSDINet achieved the highest accuracy, of 98.64%, with 1.15 M parameters in 4.70 ms, surpassing existing state-of-the-art models. This research contributes to advancing deep learning techniques in agricultural applications and offers insights into the practical implementation of seed classification systems for quality control in the soybean industry.