Analysis of TEM images of metallic nanoparticles using convolutional neural networks and transfer learning
Akira Koyama, S. Miyauchi, Ken’ichi Morooka, Hajime Hojo, Hisahiro Einaga, Yasukazu Murakami
Topics & Concepts
Convolutional neural networkTransfer of learningNanoparticleTransmission electron microscopyMaterials scienceComputer scienceArtificial intelligenceArtificial neural networkDeep learningPattern recognition (psychology)FOIL methodNanotechnologyComposite materialElectron and X-Ray Spectroscopy TechniquesCharacterization and Applications of Magnetic NanoparticlesAdvanced Electron Microscopy Techniques and Applications