Three-dimensional, dual-color nanoscopy enabled by migrating photon avalanches with one single low-power CW beam
Zhimin Zhu, Yusen Liang, Qi Zhao, Hui Wu, Binxiong Pan, Shuqian Qiao, Baoju Wang, Qiuqiang Zhan
Topics & Concepts
OpticsDiffractionMicroscopyLaserPhotonMaterials scienceTwo-photon excitation microscopyResolution (logic)Point spread functionSuper-resolution microscopyBeam (structure)STED microscopyPhysicsStimulated emissionScanning confocal electron microscopyComputer scienceFluorescenceArtificial intelligenceAdvanced Fluorescence Microscopy TechniquesOptical Coherence Tomography ApplicationsNear-Field Optical Microscopy