Electrical Performance and Reliability Enhancement of a-IGZO TFTs via Post-N<sub>2</sub>O Plasma Optimization
Hyojung Kim, Chanhee Han, Dongbhin Kim, Byoungdeog Choi
Abstract
N <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> O plasma treatment is widely implemented into the fabrication process of mass-produced amorphous oxide semiconductors for its effectiveness, simplicity, and cost efficiency. However, N <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> O plasma-treated amorphous InGaZnO (a-IGZO) thin-film transistors (TFTs) have been reported to exhibit reliability issues due to a nonideal threshold voltage ( <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${V}_{\text {th}}{)}$ </tex-math></inline-formula> shift that occurs under positive bias temperature stress (PBTS). Here, the cause of this abnormal positive bias temperature instability is investigated, and a simple solution applicable to the fabrication process for mass production is proposed. While the supply of N <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> O plasma in the fabrication chamber is immediately suspended after plasma treatment in mass production, the supply of N <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> O plasma in the chamber was maintained even during the postprocesses that follow plasma treatment for this study. While plasma-treated a-IGZO TFTs fabricated with the supply of N <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> O plasma turned off during the postprocesses exhibited nonideal negative <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${V}_{\text {th}}$ </tex-math></inline-formula> shifts under PBTS, the devices fabricated with N <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> O plasma supplied during the postprocesses exhibited superior electrical performance and reliability under bias stress. The defect and physical analyses demonstrate that the nonideal <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${V}_{\text {th}}$ </tex-math></inline-formula> shift is caused by leakage-current paths generated by the breakage of metal–oxygen bonds and the formation of weak bonds, such as −OH bonds, that occur from plasma damage and bias temperature stress, respectively. This study demonstrates that maintaining the supply of N <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> O plasma during the postprocesses is a straightforward and effective method for ensuring robust a-IGZO TFTs in mass production.