Litcius/Paper detail

New speckle pattern interferometry for precise in situ deformation measurements

Ruyue Zhang, Yu Fu, Hong Miao

2024Chinese Optics Letters14 citationsDOIOpen Access PDF

Abstract

A new electronic speckle pattern interferometry method is proposed to realize in situ deformation measurements. The feature of the method is the combination of a high-speed camera and multiple laser Doppler vibrometers (LDVs) for synchronous measurements. The high-speed camera is used to record and select effective interferograms, while the LDVs are used to measure the rigid body displacement caused by vibrations. A series of effective interferograms with known shifted phase values are obtained to calculate the deformation phase. The experimental results show that the method performs well in measuring static and dynamic deformations with high accuracy in vibrating environments.

Topics & Concepts

Speckle patternInterferometryOpticsElectronic speckle pattern interferometrySpeckle imagingDeformation (meteorology)Phase (matter)Displacement (psychology)LaserMeasure (data warehouse)Doppler effectPhysicsComputer sciencePsychologyAstronomyQuantum mechanicsDatabasePsychotherapistMeteorologyOptical measurement and interference techniquesAdvanced Measurement and Metrology TechniquesAdvanced Measurement and Detection Methods
New speckle pattern interferometry for precise in situ deformation measurements | Litcius