Multi-spectral reflection matrix for ultrafast 3D label-free microscopy
Paul Balondrade, Victor Barolle, Nicolas Guigui, Emeric Auriant, Nathan Rougier, Claude Boccara, Mathias Fink, Alexandre Aubry
Topics & Concepts
OpticsOpacityMicroscopyFrame rateMicroscopeScatteringDepth of fieldMaterials scienceImage qualityComputer sciencePhysicsComputer visionImage (mathematics)Optical Coherence Tomography ApplicationsPhotoacoustic and Ultrasonic ImagingAdvanced Fluorescence Microscopy Techniques