Reference Measurements of Error Vector Magnitude
Paritosh Manurkar, Christopher P. Silva, Joshua M. Kast, Robert D. Horansky, Dylan F. Williams, Kate A. Remley
Abstract
We demonstrate the applicability of the IEEE P1765 Reference Waveforms in ascertaining EVM and associated uncertainties by performing traceable measurements on a calibrated equivalent-time sampling oscilloscope at 44 GHz. With this knowledge, a user can employ the IEEE P1765 measurement-comparison approach using these reference waveforms in their laboratory to estimate the impact of their receiver on EVM and its associated uncertainties.
Topics & Concepts
OscilloscopeWaveformComputer scienceMagnitude (astronomy)Measurement uncertaintySampling (signal processing)Electronic engineeringCalibrationObservational errorStandard uncertaintyTelecommunicationsEngineeringStatisticsPhysicsMathematicsRadarDetectorAstronomyMicrowave and Dielectric Measurement TechniquesAdvancements in PLL and VCO TechnologiesRadio Frequency Integrated Circuit Design