Extremely bias stress stable enhancement mode sol–gel-processed SnO2 thin-film transistors with Y2O3 passivation layers
Changmin Lee, Won‐Yong Lee, Do Won Kim, Hyeon Joong Kim, Jin‐Hyuk Bae, In Man Kang, Doohyeok Lim, Kwangeun Kim, Jaewon Jang
Topics & Concepts
PassivationMaterials scienceThin-film transistorOptoelectronicsSemiconductorHysteresisThreshold voltageStress (linguistics)TransistorLayer (electronics)NanotechnologyVoltageElectrical engineeringCondensed matter physicsPhilosophyLinguisticsEngineeringPhysicsThin-Film Transistor TechnologiesZnO doping and propertiesSilicon Nanostructures and Photoluminescence