Speckle pattern optimization for DIC technologies
Szabolcs Szalai, Gábor Dogossy
Abstract
This paper contains the relation between speckle pattern and Digital Image Correlation (DIC). The most important advance in experimental mechanics has been DIC since the strain gage. The deformation (strain) of an object can be visualized by DIC. Among all scientific fields, the DIC Technologies have seen a dynamic increase. The relationship between the paint and the sample - as the patterns mediate the deformation to the cameras - has been the most important technological issue. In this article the method developed for the detection of isolated particles in alloys is used to characterize the spots, which help the best speckle pattern has determined.
Topics & Concepts
Speckle patternDigital image correlationDeformation (meteorology)Sample (material)Electronic speckle pattern interferometryDigital imageMaterials scienceComputer scienceArtificial intelligenceComputer visionImage (mathematics)OpticsImage processingPhysicsComposite materialThermodynamicsOptical measurement and interference techniquesSurface Roughness and Optical MeasurementsAdvanced Measurement and Detection Methods