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Dead Time Optimization for Synchronous Switching of SiC MOSFETs Considering Nonlinear Gate Capacitance

Yimin Zhou, Zhiqiang Wang, Guoqing Xin, Jun Yuan, Xiaojie Shi

2023IEEE Transactions on Power Electronics26 citationsDOI

Abstract

The synchronous-switching dead-time optimization is critical for high-frequency silicon carbide (SiC)-based converters operating in the synchronous rectification mode. In previous research, the constant input capacitance <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">C</i> <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">iss</sub> from the datasheet was typically utilized for dead time optimization, which is obtained with a zero gate-source voltage ( <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">V</i> <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">gs</sub> = 0). In practice, however, <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">C</i> <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">iss</sub> is strongly dependent on <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">V</i> <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">gs</sub> and cannot be regarded as a constant during synchronous turn- <sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">off</small> transient. Thus, this letter proposes an analytical model integrating <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">V</i> <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">gs</sub> -dependent gate capacitance for optimal dead time design. Experimental results show that the proposed model can accurately predict the optimal dead time, with an average error less than 2 ns under all operating conditions for three types of SiC <sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">mosfet</small> s with different gate structures.

Topics & Concepts

Computer scienceAlgorithmSilicon Carbide Semiconductor TechnologiesSemiconductor materials and devicesAdvancements in Semiconductor Devices and Circuit Design
Dead Time Optimization for Synchronous Switching of SiC MOSFETs Considering Nonlinear Gate Capacitance | Litcius