Comparative study of deep learning algorithms for atomic force microscopy image denoising
Hoichan Jung, Giwoong Han, Seong Jun Jung, Sung Won Han
Topics & Concepts
Atomic force microscopyNoise reductionArtificial intelligenceImage denoisingVisualizationNoise (video)AlgorithmInferenceImage (mathematics)Computer scienceImage processingMaterials scienceComputer visionNanotechnologyForce Microscopy Techniques and ApplicationsAdvanced machining processes and optimizationIntegrated Circuits and Semiconductor Failure Analysis