Reliability prediction of FinFET FPGAs by MTOL
Emmanuel Bender, J.B. Bernstein, Alain Bensoussan
Topics & Concepts
Reliability (semiconductor)Reliability engineeringField-programmable gate arrayComputer scienceEmbedded systemEngineeringPhysicsPower (physics)Quantum mechanicsSemiconductor materials and devicesIntegrated Circuits and Semiconductor Failure AnalysisAdvancements in Semiconductor Devices and Circuit Design