A reliability model for systems subject to mutually dependent degradation processes and random shocks under dynamic environments
Qingzhu Liang, Yinghao Yang, Changhong Peng
Topics & Concepts
Degradation (telecommunications)Reliability (semiconductor)CorrectnessDependency (UML)Gamma processMarkov processComputer scienceStochastic processReliability engineeringMonte Carlo methodProcess (computing)Mathematical optimizationMathematicsEngineeringAlgorithmStatisticsOperating systemTelecommunicationsSoftware engineeringQuantum mechanicsPower (physics)PhysicsReliability and Maintenance OptimizationLife Cycle Costing AnalysisRisk and Safety Analysis