A novel data-driven method based on sample reliability assessment and improved CNN for machinery fault diagnosis with non-ideal data
Xin Zhang, Haifeng Wang, Bo Wu, Quan Zhou, Youmin Hu
Topics & Concepts
OverfittingComputer scienceSample (material)Reliability (semiconductor)Fault (geology)Artificial intelligenceMultinomial logistic regressionMachine learningArtificial neural networkData miningConvolutional neural networkPattern recognition (psychology)Reliability engineeringEngineeringGeologyChemistryPhysicsPower (physics)SeismologyChromatographyQuantum mechanicsMachine Fault Diagnosis TechniquesFault Detection and Control SystemsEngineering Diagnostics and Reliability