Investigation of Optical and Electrical Properties of Different Compositions of As-S-Se Thin Films at Thickness 725 nm With High Precision Using a Wedge-Shaped Optical Model
Ammar Qasem, E.R. Shaaban, M.Y. Hassaan, M.G. Moustafa, Mohamed A.S. Hammam, El Sayed Yousef
Topics & Concepts
Thin filmRefractive indexMaterials scienceTransmittanceAttenuation coefficientDielectricOpticsAbsorption (acoustics)Analytical Chemistry (journal)OptoelectronicsChemistryComposite materialPhysicsNanotechnologyChromatographyPhase-change materials and chalcogenidesChalcogenide Semiconductor Thin FilmsGlass properties and applications