Layer-dependent interface reconstruction and strain modulation in twisted WSe<sub>2</sub>
Xiangbin Cai, Liheng An, Xuemeng Feng, Shi Wang, Zishu Zhou, Yong Chen, Yuan Cai, Chun Cheng, Xiaoqing Pan, Ning Wang
Abstract
, which shows a strong dependence on the constituent layer numbers and twist angles. The competition between the interlayer interaction, which varies with local atomic configurations, and the intralayer elastic deformation, related to the layer thickness, leads to rich superlattice motifs and strain modulation patterns, i.e. triangular for odd and kagome-like textures for even layer numbers, against the rigid stacking moiré model. The strain effects of small twist angles are further demonstrated by electrical transport measurements, manifesting intriguing conducting states at low temperatures beyond the flat band features of large twist angles. Our work not only provides a comprehensive understanding of layer-dependent twist structures, but also may shed light on the future design of twistronic devices.