SCL—Segmentation–Classification combined Loss for surface defect detection
Emiliano Versini, Lauro Snidaro, Alessandro Liani
Topics & Concepts
SegmentationFalse positive paradoxComputer scienceArtificial intelligencePattern recognition (psychology)Binary classificationFunction (biology)Image segmentationBinary numberMathematicsBiologyEvolutionary biologyArithmeticSupport vector machineIndustrial Vision Systems and Defect DetectionNon-Destructive Testing TechniquesInfrastructure Maintenance and Monitoring