Artificial confocal microscopy for deep label-free imaging
Xi Chen, Mikhail E. Kandel, Shenghua He, Chenfei Hu, Young Jae Lee, Kathryn Sullivan, Gregory Tracy, Hee Jung Chung, Hyun Joon Kong, Mark A. Anastasio, Gabriel Popescu
Topics & Concepts
Optical sectioningConfocalConfocal microscopyMicroscopyOpticsPhotobleachingMaterials scienceMicroscopeScanning confocal electron microscopyLaser scanningArtificial intelligenceFluorescenceComputer scienceLaserPhysicsDigital Holography and MicroscopyAdvanced Fluorescence Microscopy TechniquesOptical Coherence Tomography Applications