Morphology measurements by AFM tapping without causing surface damage: A phase shift characterization
Yang He, Yongda Yan, Yanquan Geng
Topics & Concepts
Phase (matter)Materials scienceRADIUSDissipationAmplitudeTappingExcitationRange (aeronautics)OpticsAnalytical Chemistry (journal)Composite materialChemistryAcousticsPhysicsChromatographyComputer securityQuantum mechanicsThermodynamicsOrganic chemistryComputer scienceForce Microscopy Techniques and ApplicationsAdhesion, Friction, and Surface InteractionsNear-Field Optical Microscopy