A strategy to detect the effect of electrode defects on the electrical reliability in multilayer ceramic capacitors
Weichen Zhang, Chaoqiong Zhu, Kezhen Hui, Peiyao Zhao, Limin Guo, Ziming Cai, Longtu Li, Xiaohui Wang
Topics & Concepts
Materials scienceCeramic capacitorElectrodeElectric fieldCapacitorReliability (semiconductor)Kelvin probe force microscopeCapacitanceComposite materialOptoelectronicsElectrical engineeringNanotechnologyVoltagePhysicsAtomic force microscopyPower (physics)EngineeringChemistryPhysical chemistryQuantum mechanicsFerroelectric and Piezoelectric MaterialsSemiconductor materials and devicesAnodic Oxide Films and Nanostructures