Attention mechanism-based deep learning approach for wheat yield estimation and uncertainty analysis from remotely sensed variables
Huiren Tian, Pengxin Wang, Kevin Tansey, Jie Wang, Wenting Quan, Junming Liu
Topics & Concepts
Yield (engineering)Mechanism (biology)EstimationEnvironmental scienceBiometeorologyStatisticsComputer scienceMachine learningMathematicsEcologyEngineeringBiologyPhilosophyEpistemologySystems engineeringMaterials scienceCanopyMetallurgyRemote Sensing in AgricultureSmart Agriculture and AIGreenhouse Technology and Climate Control