Quantification of the dielectric constant of MoS2 and WSe2 Nanosheets by electrostatic force microscopy
Yaoping Hou, Guorui Wang, Chengfu Ma, Zhi Hua Feng, Yuhang Chen, Tobin Filleter
Topics & Concepts
DielectricCharacterization (materials science)Materials sciencePermittivityElectrostatic force microscopeElectrostaticsCantileverWork (physics)Constant (computer programming)NanotechnologyOptoelectronicsComposite materialThermodynamicsComputer sciencePhysicsChemistryPhysical chemistryProgramming language2D Materials and ApplicationsForce Microscopy Techniques and ApplicationsConducting polymers and applications