Litcius/Paper detail

A physically inspired and bounded metric learning framework for fault detection and multi-class classification in mechanical systems

Xinming Li, Jiawei Gu, Meng Li, Wen Ying Fan, Yiming Xiao, Wenhan Lyu, Cong Du, Yanxue Wang

2025Expert Systems with Applications13 citationsDOI

Topics & Concepts

InterpretabilityThresholdingComputer scienceFault detection and isolationBounded functionArtificial intelligenceBenchmark (surveying)Feature (linguistics)Fault (geology)Similarity (geometry)Pattern recognition (psychology)Metric (unit)Compact spaceConsistency (knowledge bases)Feature vectorCurse of dimensionalityMachine learningData miningNovelty detectionFeature extractionAlgorithmPerformance metricTransformation (genetics)TestabilityProperty (philosophy)Machine Fault Diagnosis TechniquesAnomaly Detection Techniques and ApplicationsFault Detection and Control Systems