Light emitting diode degradation and failure occurrence modelling based on accelerated life test
David Vališ, Marie Forbelská, Zdeněk Vintr, Quoc Tiep La, Zdeněk Kohl
Topics & Concepts
Degradation (telecommunications)Materials scienceReliability engineeringFailure mechanismAccelerated life testingOptoelectronicsEngineeringElectronic engineeringComposite materialPsychologyMaturity (psychological)Developmental psychologyIndustrial Vision Systems and Defect DetectionGaN-based semiconductor devices and materialsSurface Roughness and Optical Measurements