Degradation reliability modeling for two-stage degradation ball screws
Hua-Xi Zhou, Chang-Guang Zhou, Xiaoyi Wang, Hutian Feng, Jinglun Xie
Topics & Concepts
Ball (mathematics)Degradation (telecommunications)RandomnessBall screwReliability (semiconductor)Computer scienceReliability engineeringEngineeringStructural engineeringMathematicsStatisticsThermodynamicsPhysicsMathematical analysisTelecommunicationsNutPower (physics)Reliability and Maintenance OptimizationFatigue and fracture mechanicsProbabilistic and Robust Engineering Design