DML-PL: Deep metric learning based pseudo-labeling framework for class imbalanced semi-supervised learning
Mi Yan, Siu Cheung Hui, Ning Li
Topics & Concepts
Metric (unit)Artificial intelligenceComputer scienceMachine learningBenchmark (surveying)Semi-supervised learningClass (philosophy)Deep learningFeature (linguistics)Cluster analysisPattern recognition (psychology)PhilosophyGeodesyOperations managementLinguisticsEconomicsGeographyImbalanced Data Classification TechniquesCOVID-19 diagnosis using AIText and Document Classification Technologies