Variability and origins of grain boundary electric potential detected by electron holography and atom-probe tomography
Xin Xu, Yuzi Liu, Jie Wang, Dieter Isheim, Vinayak P. Dravid, Charudatta Phatak, Sossina M. Haile
Topics & Concepts
Grain boundaryMaterials scienceAtom probeElectron holographyChemical physicsIonic bondingElectronSpace chargeCharge (physics)Condensed matter physicsImpurityAtom (system on chip)CrystalliteIonNanotechnologyChemistryPhysicsMetallurgyMicrostructureNuclear physicsEmbedded systemQuantum mechanicsOrganic chemistryTransmission electron microscopyComputer scienceAdvanced Materials Characterization TechniquesElectronic and Structural Properties of OxidesAdvanced materials and composites