MAST-SEY: MAterial Simulation Toolkit for Secondary Electron Yield. A monte carlo approach to secondary electron emission based on complex dielectric functions
Maciej P. Polak, Dane Morgan
Topics & Concepts
Monte Carlo methodPhysicsElectronComputational physicsDielectricSecondary electronsSecondary emissionDensity functional theoryScatteringInelastic scatteringStatistical physicsWave functionQuantum mechanicsMathematicsStatisticsElectron and X-Ray Spectroscopy TechniquesX-ray Spectroscopy and Fluorescence AnalysisSemiconductor materials and devices